NIST Technicalendar August 2 to August 6, 2004 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/.
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In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

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10:30 AM - Analysis of Poly(lactic acid) Amorphous Chain Structure Associated with Crystallization and Deformation Behavior
10:45 AM - DEPTHX- Pushing the limits of Silicon Intelligence and Autonomous Robotics
11:00 AM - Controlling and measuring a single donor electron in silicon

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8/2 -- MONDAY

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8/3 -- TUESDAY

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8/4 -- WEDNESDAY

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8/5 -- THURSDAY

10:30 AM - POLYMERS DIVISION SEMINAR: Analysis of Poly(lactic acid) Amorphous Chain Structure Associated with Crystallization and Deformation Behavior
Poly(lactic acid) (PLA) is a widely used biomaterial, as well as a new generation plastic. This is due to its biocompatibility, biodegradability and sustainability. Investigation of amorphous chain structure characteristics such as conformation, configuration, monomer residue junction, and chain stiffness can provide a fundamental understanding on industrial processing and physical properties. Raman spectroscopy, static light scattering, viscometry, in combination with normal coordinate analysis on disordered chain are used to characterize and analyze PLA in solid and solution states from segmental to molecular scales. This study has shown that the "trans-gauche-trans" (tgt) conformer is the dominant conformation (~80%) in the rotational isomeric state model of PLA, suggesting a stiff chain nature. The study has also shown that chain stiffness slowly decreases with defect content, reflecting a non-random nature in chain statistics and an elevated conformational energy at junction units. In addition, it is found that the amorphous chain deformation is associated with a distorted conformational distribution in which the tgt population increases with stress.
Shuhui Kang , University of Massachusetts-Amherst.
224 Bldg, Rm. A312. (NIST Contact: Vivek Prabhu, 301-975-3657, vprabhu@nist.gov)

10:45 AM - MATERIALS AND CONSTRUCTION RESEARCH DIVISION SEMINAR: DEPTHX- Pushing the limits of Silicon Intelligence and Autonomous Robotics
The large Jovian moon Europa may be hiding liquid water beneath its frozen crust. Europa's frosty surface has intrigued scientists ever since the Voyager spacecraft missions flew through the Jupiter system in 1979. At -260° F, the moon's surface temperature could deep-freeze an ocean over several million years, but it's possible that warmth from a tidal tug of war with Jupiter and neighboring moons could be keeping large parts of Europa's subsurface in a liquid state. Tidal friction from Jupiter is also thought to be responsible for volcanic activity on Europa's neighbor Io, and for a similar underground ocean on Callisto. A number of prominent microbiologists along with NASA planetary scientists strongly believe that Europa may harbor the best bet for locating extraterrestrial life, despite the fact that its surface is lethal to humans due to high velocity ion impact whipped up in the Jovian gravitational field. This, plus the substantial travel time, make the exploration of the purported subsurface ocean, and the ultimate search for life therein, a job tailor made for a robot. The mission NASA envisions involves a 3-stage spacecraft consisting of a lander, a nuclear powered "cryobot" that melts its way down through up to 10 kilometers of ice and which then deploys the third stage: an autonomous "hydrobot" that propels itself into water depths that may ultimately reach 50 kilometers in a totally uncharted world, uses a hierarchical discrimination science payload to "sniff" out life metabolites and environmental gradients favorable to life, locates, verifies, and collects microbiological lifeforms, uses its own just-created world map to return to the cryobot, and then "phones home" with the data. In April 2004 NASA funded a 3-year project known as DEPTHX, to build and test the prototype Europa third stage… the hydrobot. If successful, DEPTHX will generate radical advances in autonomous navigation and in the ability for silicon intelligence to discriminate life. Bill Stone, who is leading a consortium of six university and industry partners to develop DEPTHX, will speak on the origins of the project, some of the more novel technical directions being investigated, and the ultimate expedition to the world's deepest cenote where the vehicle will be field tested in 2007.
William Stone , Leader, Construction Metrology and Automation Group, Materials and Construction Research Division.
Polymers (224) Bldg, Rm. B245. (NIST Contact: Li-Piin Sung, 301-975-6737, lipiin@nist.gov)

11:00 AM - QUANTUM ELECTRICAL METROLOGY DIVISION SEMINAR: Controlling and measuring a single donor electron in silicon
Detection of charge motion at the level of individual dopant atoms is attractive both for probing the fundamental physics of these dopants and for its application toward future atomic scale or quantum electronic devices. The high charge sensitivity (better than 10^-5 e/\sqrtHz) of a single electron transistor (SET) should make such a measurement possible, provided that the dopant is located near enough to the SET. Previous measurements of SET's in the presence of strong electric fields have revealed large numbers of nearby mobile charges. To pinpoint the nature of these charges we are measuring SET's on oxidized Si substrates with a buried dopant layer, and we see marked differences between doped and intrinsic samples. We also observe gate-controlled two-level signals that we believe are coming from defects. By reducing the doping so that only a few donors lie beneath the SET we hope to observe transfer of a single electron between its donor site and the nearby oxide barrier.
Kenton Brown , Laboratory for Physical Sciences.
Physics Building, Room A366. (NIST Contact: Neil Zimmerman, 301-975-5887, neilz@nist.gov)


8/6 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

9/22/04 9:00 AM - POLYMERS DIVISION SEMINAR: NIST-Wide Mass Spectrometry Meeting
****Wednesday, September 22, 2004, from 9:00 a.m. to 12:00 noon****** Each project leader working in mass spectrometry is invited to give a 15-20 minute presentation focusing on not just the technical aspects of what they do but also the NIST rationale for why they do it. The goal is to strengthen the MS community at NIST. The first step to see who we are, what we do, and why we do it.
. . , ..
Administration Building, Lecture Room A. (NIST Contact: William E. Wallace, 301-975-5886, william.wallace@nist.gov)

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MEETINGS ELSEWHERE


8/2 -- MONDAY

No Scheduled Events

8/3 -- TUESDAY

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8/4 -- WEDNESDAY

No Scheduled Events

8/5 -- THURSDAY

No Scheduled Events

8/6 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

NEWBURY, D. : SPECTRUM IMAGE MAPPING WITH A SILICON DRIFT DETECTOR (SDD) IN AN SEM.
Microscopy and Microanalysis 2004 Conference, Savannah, GA, 8/1.

NEWBURY, D. : TUTORIAL: ENERGY DISPERSIVE X-RAY SPECTROMETRY IN THE SCANNING ELECTRON MICROSCOPE.
Microscopy and Microanalysis 2004 Conference, Savannah, GA, 8/1.

NEWBURY, D. : "MAXIMUM CHANNEL SPECTRUM" AN INTUITIVE SOFTWARE TOOL FOR DETECTING AND RECOVERING RARE FEATURES IN SPECTRUM IMAGE DATACUBES.
Microscopy and Microanalysis 2004 Conference, Savannah, GA, 8/1.

AMIS, E. : COMBINATORIAL METHODS FOR INVESTIGATING MULTIPHASE MIXTURES.
Gordon Research Conference on Polymer Physics, Connecticut College, New London, CT, 8/1.

FONG, J. : DESIGN OF NUMERICAL EXPERIMENTS FOR A CLASS OF PROBLEMS IN PENETRATION MECHANICS WITH EXACT SOLUTIONS.
Applied Research Associates, Denver, CO, 8/2.

SCOTT, J. : MEASURING SPECTRAL VARIATION IN XEDS SPECTRUM IMAGES.
Microscopy and Microanalysis 2004, Microscopy Society of America and Microbeam Analysis Society, Savannah, GA, 8/2.

JACH, T. : PRESENT WORKSHOP ON "X-RAY PHYSICS".
2004 Denver X-Ray Conference, Steamboat Springs, CO, 8/2.

SIEBER, J. : XRF APPLICATIONS AND PRACTICES IN THE PETROLEUM INDUSTRY.
X-Ray Conf., Steamboat Springs, CO, 8/3.

BURNETT, J. : HIGH INDEX MATERIALS FOR 193NM & 157NM IMMERSION LITHOGRAPHY.
Immersion & 157nm Symposium, Vancouver, British Columbia, Canada, 8/3.

MARINENKO, R. : A NEW NIST SRM FOR MICROANALYSIS AND X-RAY FLUORESCENCE, TIAL(NBW) ALLOY.
Microscopy and Microanalysis 2004 Meeting, Savannah, Georgia, 8/3.

EPPELDAUER, G. : SPECTRAL IRRADIANCE RESPONSIVITY MEASUREMENTS BETWEEN 1 µM AND 5 µM.
SPIE 2004 (International Society for Optical Engineering), Denver, CO, 8/3.

RITCHIE, N. (Co-Authors: T.Jach , N.I.S.T., Gaithersburg, MD, terrence.jach@nist.gov J.Small , N.I.S.T., Gaithersburg, MD, john.small@nist.gov) Newbury, D., N.I.S.T. Hilton, G., N.I.S.T. Irwin, K., N.I.S.T. Ullom, J., N.I.S.T. : STABILITY OF MICROCALORIMETER WITH TRANSITION EDGE SENSOR FOR X-RAY DETECTION.
Microscopy and Microanalysis 2004, Savannah, GA, 8/3.

GERMER, T. : PREDICTING, MODELING AND INTERPRETING LIGHT SCATTERED BY SURFACES.
Society of Photo-Optical Instrumentation Engineers (SPIE) Conf., Denver, CO, 8/4.

OHNO, Y. : COLOR RENDERING AND LUMINOUS EFFICACY OF WHITE LED SPECTRA.
SPIE 2004 (International Society for Optical Engineering), Denver CO, 8/4.

MILLER, C. : LED PHOTOMETRIC CALIBRATIONS AT NIST AND FUTURE MEASUREMENT NEEDS OF LEDS.
SPIE 2004 (International Society for Optical Engineering), Denver CO, 8/4.

FRYC, I. : A SPECTRALLY TUNABLE SOLID STATE SOURCE FOR RADIOMETRIC, PHOTOMETRIC, AND COLORIMETRIC APPLICATION.
SPIE 2004 (International Society for Optical Engineering), Denver CO, 8/4.

WONG-NG, W. (Co-Authors: I.Levin , Vaudin, M. Cook, L.P. and Feenstra, R. ) : BAF^D2^ PROCESS: PHASE EVOLUTION OF BAF^D2^YCU^D3^O^D6+X^ FILMS.
53rd Annual Denver X-Ray Conf., Steamboat Springs, CO, 8/4.

JACH, T. : IMPROVING ENERGY STABILITY IN THE NIST MICROCALORIMETER X-RAY DETECTOR.
2004 Denver X-Ray Conference, Steamboat Springs, CO, 8/5.

WONG-NG, W. (Co-Authors: I.Levin Q.Huang ) Cook, L.P. : BAF^D2^PROCESS OF LONG-LENGTH CONDUCTORS: HIGH-TEMPERATURE NEUTRON AND X-RAY STUDY OF YOF.
53rd Annual Denver X-Ray Conf., Steamboat Springs, CO, 8/6.

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ANNOUNCEMENTS

2004 WORLD STANDARDS DAY PAPER COMPETITION
The Standards Engineering Society (SES), in conjunction with the World Standards Day (WSD) Planning Committee, has announced the theme, awards, and rules for participation in the 2004 WSD Paper Competition. "Standards Connecting the World" is the paper topic. The winners will be acknowledged and receive their awards during the annual World Standards Day Dinner on Wednesday, October 13, 2004, in Washington, DC.The author(s) of the winning submission will receive $2,500 along with a plaque; second and third place winners will receive cash awards of $1,000 and $500 respectively. The winning papers will be published in the SES journal (Standards Engineering) and be available on the SES website. The first place winner will also appear as a special article in the ANSI Reporter. This year’s theme, “Standards Connecting the World,” gives practically anyone involved in standards development, management the opportunity to make themselves heard. “Connections”could be viewed in any number of various ways: from transportation issues, security measures, global trade, Internet access, and goods and services that bring people in dissimilar locales together. A panel of independent judges selected by SES and approved by the WSD Planning Committee will review the papers. The SES Executive Director must receive all submissions and accompanying official entry forms by August 27, 2004. Entry forms, along with a complete set of rules and eligibility requirements, can be obtained from the SES Office, 13340 SW 96th Avenue, Miami, FL 33176; (305) 971-4798; fax (305) 971-4799; email - hgziggy@worldnet.att.net or through the SES Home Page - http://www.ses-standards.org Established in 1947, the Standards Engineering Society is a not-for-profit professional membership society whose mission is to promote the use of standards and to enhance the knowledge of standardization. It is the member body for the United States and Canada in the International Federation of Standards Users (IFAN) and is accredited by the American National Standards Institute (ANSI). SES members are primarily involved in the application and use of company, government, national, regional, and international standards.
NIST Contact: Ellen Trager, 301-975-4038, ellen.trager@nist.gov

VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST contact" for the particular event you would like to attend.
NIST Contact: . ., ., .

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NIST WEB SITE ANNOUNCEMENTS

THE NIST VIRTUAL LIBRARY WEB SITE
You're invited to visit the NIST Virtual Library (NVL) Web site located at http://nvl.nist.gov. Use the databases, e-journals and subject guides. Read current and past articles in the Journal of Research, the Information Services Directions newsletter, and the NIST Technicalendar newsletter. The features available on the NVL are endless. Take a few minutes today to visit the NVL. We're open 24 hours a day, seven days a week, 365 days a year.
NIST Contact: . ., 301-975-3052, library@nist.gov

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For more information, contact Ms. Sharon Mingo, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (8225); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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