|
NIST Quick Technicalendar
November 9 to November 13, 2009 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal. |
| This Issue only All Issues |
No Scheduled EventsTUESDAY - 11/10
10:30 AM - Spin relaxation and quantum interference in InSb and InAs based heterostructuresWEDNESDAY - 11/11
No Scheduled EventsTHURSDAY - 11/12
1:30 PM - Decision Making and Collective Dynamics of CellsFRIDAY - 11/13
10:30 AM - A New X-Ray Metrology for Determining Cross-Sectional Profile of Semiconductor Device Pattern
11/17/09 10:30 AM - Nanoimprinted Transparent Metal Electrodes and Their Applications in Organic Solar Cells
11/24/09 10:30 AM - PROCESS MEASUREMENTS DIVISION SEMINAR
12/3/09 10:30 AM - 1/f Noise and Dephasing from Surface Magnetic States in Superconducting Circuits
12/3/09 1:30 PM - NOTE DATE CHANGE***Stability in a Turbulent (FERMI) Sea: The Ever More Remarkable High Temperature Superconductors
12/9/09 10:30 AM - Judge Harry T. Edwards and Professor Constantine Gatsonis – Co-chairs of the National Academies Committee Investigating Forensic Science in the United States – to Present Findings and Recommendations
No Scheduled EventsTUESDAY - 11/10
No Scheduled EventsWEDNESDAY - 11/11
No Scheduled EventsTHURSDAY - 11/12
No Scheduled EventsFRIDAY - 11/13
No Scheduled Events
No Scheduled Events
11/9 - Effects of Elastic Scattering and Analyzer Acceptance Angle on the Analysis of Angle-Resolved XPS Data
11/9 - NIST Traceable Vacuum Standards Based upon MEMS Resonant Silicon Gauge Technology
11/9 - Ellipsometric Depth Profiling of Polymer-Blend Films for Organic Electronics and Photovoltaics
11/9 - Building a Multidisciplinary Research Program That Leverages on our National Facilities: The Perspective of a Federal Government Laboratory
11/10 - Behavior of Engineered Nanoparticles in Aquatic Environments - An Overview
11/13 - Thermodynamic Underpinnings of Cell Alignment on Controlled Topographies
Diversity Day 4: Generational Diversity
The critical role of defect structural relaxation in interpreting noise measurements in MOSFETs
Electron Beam Induced Deposition (EBID) of carbon interface between carbon interconnect and metal electrode. 11/10/2009, 1pm, 217/H107
Visitor Registration for NIST Events
17th Annual Sigma Xi Postdoctoral Poster Presentation: Call for Posters
No Web Site announcements this week.