Front Cover–Title Page–Contents 539 kb

Articles

Unertainty in Quantitative Electron Probe Microanalysis 64 kb
Kurt F. J. Heinrich

Accurate Cross Sections for Microanalysis 230 kb
Peter Rez

Optimization of Wavelength Dispersive X-ray Spectometry Analysis Conditions 144 kb
Stephen J. B. Reed

High Count Rate Electron Probe Microanalysis 195 kb
Joseph D. Geller and Charles Herrington

Decomposition of Wavelength Dispersive X-Ray Spectra 1758 kb
Guy Rémond, Robert Myklebust, Michel Fialin, Clive Nockolds, Matthew Phillips, and Claude Roques-Carmes

Limitations to Accuracy in Extracting Characteristic Line Intensities From X-Ray Spectra 573 kb
Peter J. Statham

Averaging of Backscatter Intensities in Compounds 187 kb
John J. Donovan, Nicholas E. Pingitore, Jr., and Andrew J. Westphal

The Analysis of Particles at Low Accelerating Voltages (< 10 kV) With Energy Dispersive X-Ray Spectroscopy (EDS) 605 kb
J. A. Small

X-Ray Microananlysis in the Variable Pressure (Environmental) Scanning Electron Microscope 3485 kb
Dale E. Newbury

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy 444 kb
Dale E. Newbury

The Microcalorimeter for Industrial Applications 374 kb
Del Redfern, Joe Nicolosi, Jens Höhne, Rainer Weiland, Birgit Simmnacher, and Christian Hollerich

Sample Preparation for Electron Probe Microanalysis–Pushing the Limits 2115 kb
Joseph D. Geller and Paul D. Engle

Implications of Polishing Techniques in Quantitative X-Ray Microanalysis 3745 kb
Guy Rémond, Clive Nockolds, Matthew Phillips, and Claude Roques-Carmes

Copper Oxide Precipitates in NBS Standard Reference Material 482 1472 kb
Eric S. Windsor, Robert A. Carlton, Greg Gillen, Scott A. Wight, and David S. Bright

Smithsonian Microbeam Standards 90 kb
Eugene Jarosewich

NIST Standards for Microanalysis and the Certification Process 105 kb
R. B. Marinenko

Contamination in the Rare-Earth Element Orthophosphate Reference Samples 195 kb
John J. Donovan, John M. Hanchar, Phillip M. Picolli, Marc D. Schrier, Lynn A. Boatner, and Eugene Jarosewich

Characterization of Corning EPMA Standard Glasses 95IRV, 95IRW, and 95IRX 301 kb
Paul Carpenter, Dale Counce, Emily Kluk, and Carol Nabelek

Microbeam Characterization of Corning Archeological Reference Glasses: New Additions to the Smithsonian Microbeam Standard Collection 426 kb
Edward P. Vicenzi, Stephen Eggins, Amelia Logan, and Richard Wysoczanski

Indexes to Volume 107

Subject Index to Volume 107 63 kb

Author Index to Volume 107 347 kb

News Briefs kb

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)

NIST Journal of Research Home Page

Date Created: February 06, 2003
Last Modifed: February 21, 2006