Issued six times a year, the Journal of Research reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology. Papers cover a broad range of subjects with major emphasis on measurement methodology and the basic technology underlying standardization. Also included, on occasion, are articles on topics closely related to the Institute's technical and scientific programs. Contained here are this month's table of contents. http://nvl.nist.gov/pub/nistpubs/jres/current.htm en-us 30 http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A01.pdf http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A01.pdf L. Lucas and L. Pibida http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A02.pdf http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A02.pdf >Michelle OBrien and Ludwig Bueermann http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A03.pdf http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A03.pdf Hassel Ledbetter and Takaho Tanaka http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A04.pdf http://nvl.nist.gov/pub/nistpubs/jres/114/6/V114.N06.A04.pdf Richard Tumanjong Azuah, Larry R. Kneller, Yiming Qiu, Philip L. W. Tregenna-Piggott, Craig M. Brown, John R. D. Copley, and Robert M. Dimeo